商品代碼:3844223

  • ROHS檢測機、X熒光光譜機、鍍層厚度分析機、重金屬測試機
    商品代碼: 3844223
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    1.4.產品圖片Picture of EXD 1800B

     



     

     

    EDX 1800B model機型

    EDX 1800B Model

     

    1.5.工作條件Working Condition

    工作溫度:15-30℃                             Working temperature: 15-30℃

    相對濕度:≤70%                                 Relative humidity: ≤70%

      源:AC: 220±5V                                    Power supply: AC 220±5V

    1.6.技術性能及指標:Technical Performance and Specifications

    1.6.1.元素分析范圍從硫S到鈾U77種元素)     

    The elements can be analyzed from the sulphur (S) to uranium (U)

    1.6.2.元素含量分析范圍為1ppm99.99%     

    The element content range from 1 ppm to 99.99% can be analyzed.

    1.6.3.測量時間:60-200    Measurement time: 60-200s

    1.6.4. RoHS指令規定的有害元素(限Cd/Pb/Cr/Hg/Br)其檢測限度最高達2ppm   

    Detecting for hazardouselements(onlyCd/Pb/Cr/Hg/Br)restricted in RoHS directive, the limit can reach 2ppm

    1.6.5玩具重金屬:鉛(Pb)、汞(Hg)、鎘(Cd)、鉻(Cr)、溴(Br.(AS).,(Sb).(Se)(Ba)

    1.6.6.多次測量重復性可達0.1%(總熒光強度)(當樣品含量大於96%); 

    The measurement repeatability on many occasions can reach 0.1% of total intensity of fluorescence when the content of samples is greater than 96%.

    1.6.7.長期工作穩定性為0.1%;(總熒光強度)

    Long-term working stability being 0.1% (total intensity offluorescence)

    1.6.8.能量分辨率為135±5電子伏特Energy resolution: 135±5eV

    1.6.9.溫度適應范圍為15℃30℃ Suitable temperature range is from 15℃ to 30℃

    1.6.10.電源:交流220±5V;(建議配置交流凈化穩壓電源。)

    Power supply: AC 220±5V. The purified AC regulated power supply is recommended.)

    1.6.11.相互獨立的基體效應校正模型     Independent matrix effect correction model

    1.6.12.多變量非線性回歸程序Multi-variable non-linear regression procedure

    1.6.13.任意多個可選擇的分析和識別模型     Arbitrary optional analysis and identification models

    1.6.14.一次可同時分析24個元素         Ability toanalyze24 elements simultaneously

    1.6.15機器誤差:在測試含量在100ppm內的時候誤差會在正負10ppm以內,含量在100-1000ppm以上時誤差會在正負10%以內,,含量在1000ppm以上時誤差會在正負15%以內

     

    2.機器硬件部分主要配置Main Hardware Configuration of EDX 1800B

    2.1 矽針半導體探測器+放大電路:(最新型的探測器) 

    Silicon Pin Semiconductor Detector + Amplifier Circuit(streamlined detector)

    技術指標及功能: Technical Specifications and Features:

    2.1.1.電制冷半導體探測器;分辨率:135±5電子伏特Electro-refrigeration semiconductor detector; Resolution: 135±5eV

    2.1.2.對樣品特征X射線進行探測;把探測采集的信息進一步放大。對樣品的檢出限、測試精度大大提高。Detecting characteristic X rays of the samples, and amplifying the information from the detection. The detection limit is reduced and detection accuracy is increased greatly.

     

    2.2   X光管X-Ray Tube

    技術指標及功能: Technical Specifications and Features:

    2.2.1.使用壽命大於2萬小時Service life is longer than 20,000 hours.

    2.2.2.產生X射線激發樣品Emitting X rays to excite the samples

     

    2.3高、低壓電源High/Low Voltage Power Supply

    技術指標及功能: Technical Specifications and Features:

    2.3.1.550kV1毫安     550kV, 1mA

    2.3.2.X光提供專用電源     Providing power supply exclusively to X-ray



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