Members of the Texas Instruments
SCOPE E Family of Testability Products
Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port
and Boundary-Scan Architecture
Functionally Equivalent to ’F245 and
’ABT245 in the Normal-Function Mode
SCOPE E Instruction Set:
– IEEE Standard 1149.1-1990 Required
Instructions, Optional INTEST, CLAMP,
and HIGHZ
– Parallel-Signature Analysis at Inputs
With Masking Option
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Even-Parity Opcodes
Two Boundary-Scan Cells per I/O for
Greater Flexibility
State-of-the-Art EPIC-IIBE BiCMOS Design
Significantly Reduces Power Dissipation
Package Options Include Plastic
Small-Outline Packages (DW), Ceramic
Chip Carriers(FK), and Standard Ceramic
DIPs (JT)

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